TY  - BOOK
AU  - Amerasekera,E.A.
AU  - Campbell,D.S.
TI  - Failure mechanisms in semiconductor devices
SN  - 0471914347 :
AV  - TK7871.85 .A49 1987
U1  - 621.3815/2 19
PY  - 1987///
CY  - Chichester [West Sussex], New York
PB  - Wiley
KW  - Semiconductors
KW  - Electrical engineering ,Electronics .Nuclear engineering
KW  - Failures
N1  - Includes indexes; Bibliography: p. 179-195
UR  - http://www.loc.gov/catdir/enhancements/fy0607/86028174-d.html
UR  - http://www.loc.gov/catdir/enhancements/fy0607/86028174-t.html
ER  -